Checkpoint Technologies Announces 125 nm Optical Resolution Breakthrough with Visible Light
December 10, 2015 | By Business Wire News
SAN JOSE, Calif.
Checkpoint Technologies, LLC, announces a technological achievement. Utilizing its industry leading SIL technology, laser scanning microscopy and visible light, the company demonstrated optical resolution of 125 nm pitch of lines and spaces, in silicon integrated circuits. This is believed to be the smallest optical resolution achieved in the world.
Dr. G. Xiao, Co-Founder and Chief Technology Officer said, “We believe that this is the smallest optical resolution achieved with midrange visible light, through the backside of silicon, 125 nm pitch – 62.5 nm lines and 62.5 nm spaces.” Dr. Xiao went on to say that, “this achievement in visible light resolution is a substantial technological achievement in the failure analysis and optical debugging marketplace.”
Checkpoint Technologies, LLC, is a recognized leader in the failure analysis industry supplying laser scanning and photon emission microscopy systems for diagnostic purposes used by major semiconductor manufacturers.
About Checkpoint Technologies:
Founded in 1995, Checkpoint Technologies develops and manufactures optical failure analysis tools that are used by semiconductor manufacturers to improve the speed and reliability of integrated circuits. Checkpoint’s role is to help integrated circuit manufacturers produce more reliable and better functioning electronic devices. Checkpoint Technologies is headquartered in San Jose, California USA with worldwide sales and service. www.checkpointtechnologies.com
View source version on businesswire.com: http://www.businesswire.com/news/home/20151210005317/en/
Checkpoint Technologies, LLC
Michael Jupina, Ph.D., 408-321-9780 ext. 102
mjupina@checkpointtechnologies.com
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