Metrology, Inspection and Process Control in VLSI Manufacturing – Increase in Complexity & Cost of Semiconductors – Research and Markets
May 18, 2016 | By Business Wire News
DUBLIN
Research and Markets has announced the addition of the “Metrology, Inspection, and Process Control in VLSI Manufacturing” report to their offering.
The increase in complexity of semiconductors and the resulting increase in the complexity and cost of the semiconductor manufacturing process has been a driver of demand for metrology and inspection systems.
This report offers a complete analysis of the Process Control market, segmented as: Lithography Metrology; Wafer Inspection/Defect Review; Thin Film Metrology; and Other Process Control Systems. Each of these sectors is further segmented. Market shares of competitors for all segment is presented.
Key Topics Covered:
Chapter 1 Introduction
Chapter 2 Executive Summary
Chapter 3 Metrology/Inspection Technologies
Chapter 4 Defect Review/Wafer Inspection
Chapter 5 Thin Film Metrology
Chapter 6 Lithography Metrology
Chapter 7 Market Forecast
Chapter 8 Integrated/In-Situ Metrology/Inspection Trends
Chapter 9 Key Drivers
For more information visit http://www.researchandmarkets.com/research/bbzf9q/metrology
View source version on businesswire.com: http://www.businesswire.com/news/home/20160518005664/en/
Research and Markets
Laura Wood, Senior Manager
press@researchandmarkets.com
For E.S.T Office Hours Call 1-917-300-0470
For U.S./CAN Toll Free Call 1-800-526-8630
For GMT Office Hours Call +353-1-416-8900
U.S. Fax: 646-607-1907
Fax (outside U.S.): +353-1-481-1716
Sector: Semiconductor
