MRO Magazine

Metrology, Inspection and Process Control in VLSI Manufacturing – Increase in Complexity & Cost of Semiconductors – Research and Markets


May 18, 2016
By Business Wire News

DUBLIN

Research and Markets has announced the addition of the “Metrology, Inspection, and Process Control in VLSI Manufacturing” report to their offering.

The increase in complexity of semiconductors and the resulting increase in the complexity and cost of the semiconductor manufacturing process has been a driver of demand for metrology and inspection systems.

This report offers a complete analysis of the Process Control market, segmented as: Lithography Metrology; Wafer Inspection/Defect Review; Thin Film Metrology; and Other Process Control Systems. Each of these sectors is further segmented. Market shares of competitors for all segment is presented.

Key Topics Covered:

Chapter 1 Introduction

Chapter 2 Executive Summary

Chapter 3 Metrology/Inspection Technologies

Chapter 4 Defect Review/Wafer Inspection

Chapter 5 Thin Film Metrology

Chapter 6 Lithography Metrology

Chapter 7 Market Forecast

Chapter 8 Integrated/In-Situ Metrology/Inspection Trends

Chapter 9 Key Drivers

For more information visit http://www.researchandmarkets.com/research/bbzf9q/metrology

Research and Markets
Laura Wood, Senior Manager
press@researchandmarkets.com
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