Virtual instrumentation conference set for Aug. 13
Austin, Texas -- National Instruments will hold its ninth annual customer and technology conference for virtual ins...
Austin, Texas — National Instruments will hold its ninth annual customer and technology conference for virtual instrumentation Aug. 13-15, 2003, at the Austin Convention Center.
The NIWeek 2003 conference will feature interactive technical sessions, hands-on training, exhibitions and workshops on the latest products and technologies for control design, measurement, automation, manufacturing and test
A guest keynote speaker is Brian Muirhead, former project manager of the Mars Pathfinder mission and current chief engineer of the Mars Science Laboratory. Muirhead will share his knowledge, experiences and vision of the roles of software and hardware technology in space exploration. He will also discuss applications of NI products in some of his group’s most challenging missions.
“For years engineers and scientists like Brian Muirhead have gathered at NIWeek to learn from NI developers and fellow users about how to benefit from standard, affordable computer technology through NI’s powerful software and modular hardware,” said Dr. James Truchard, president, co-founder and CEO of NI. “The dramatic cost savings and productivity gains of virtual instrumentation help our customers meet tight time and budget requirements in applications that span entire product life cycles — from design to manufacturing.”
NIWeek 2003 will offer more than 140 technical sessions from NI developers and other industry experts. The conference will feature technical presentations from companies such as Microsoft, NASA and Texas Instruments that highlight unique approaches to solving measurement and automation applications using virtual instrumentation.
Also, NI will showcase three pavilions on the NIWeek show floor. The LabView Design Pavilion will feature NI LabView integrated with common design tools for DSP, analog, RF and embedded control. In the Sensors Pavilion, sensor vendors will display smart transducer electronic data sheets (TEDS) and virtual TEDS sensors along with NI TEDS-capable LabView software and data acquisition products. The Analog and Digital Test Pavilion will highlight new manufacturing test applications, including functional test and device characterization.
In 2002, NIWeek drew attendance from NI customers in more than 48 countries, representing a variety of industries such as automotive, biotech, consumer electronics, nanotechnologies and aerospace.
For more information visit www.ni.com/niweek.